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Solar Cell Inspection


Limitations of Current Inspection Processes

Low Accuracy

As an inspector conducts visual inspection and classification

for EL images with the naked eye, accuracy can deteriorate

along with increasing fatigue. There is also a high degree of

deviation between the accuracies depending on experience

and proficiency levels among the inspectors.

Increased Production Costs

If initial inspection fails to identify a defect and allows a defective

cell to end up in post-processing, unnecessary production costs will be

incurred. As such, accurate detection of defects is crucial.

Why Solar Cell Inspection Is Difficult

Ambiguity Between Wafer Background and Defects

Cell and module defects such as spider cracks and

fingerprints easily mix with the background of the wafer,

making it difficult to point out the defects. Existing machine

vision technologies cannot distinguish between defects

and wafers, and automation for this area was not possible.

Benefits Offered by SuaKIT

Automated Inspection of EL Images Leading to

Increased Accuracy and Reduced Production Cost

The machine, based on SUALAB's deep learning technology,

learns the complex types of EL image defects so that only

the defects can be accurately identified and classified.

High-accuracy unmanned automatic inspection is possible

even if there are changes to the wafer supplier and/or the

defect standards. The customer can obtain benefits from

this technology, including decreased production costs.