Solar Cell Inspection
Limitations of Current Inspection Processes
As an inspector conducts visual inspection and classification
for EL images with the naked eye, accuracy can deteriorate
along with increasing fatigue. There is also a high degree of
deviation between the accuracies depending on experience
and proficiency levels among the inspectors.
Increased Production Costs
If initial inspection fails to identify a defect and allows a defective
cell to end up in post-processing, unnecessary production costs will be
incurred. As such, accurate detection of defects is crucial.
Why Solar Cell Inspection Is Difficult
Ambiguity Between Wafer Background and Defects
Cell and module defects such as spider cracks and
fingerprints easily mix with the background of the wafer,
making it difficult to point out the defects. Existing machine
vision technologies cannot distinguish between defects
and wafers, and automation for this area was not possible.
Benefits Offered by SuaKIT
Automated Inspection of EL Images Leading to
Increased Accuracy and Reduced Production Cost
The machine, based on SUALAB's deep learning technology,
learns the complex types of EL image defects so that only
the defects can be accurately identified and classified.
High-accuracy unmanned automatic inspection is possible
even if there are changes to the wafer supplier and/or the
defect standards. The customer can obtain benefits from
this technology, including decreased production costs.